Particles on Surfaces: Detection: Adhesion, and Removal First Edition Mittal 1000148475 9781000148473

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Product details:

• ISBN 10: 1000148475
• ISBN 13: 9781000148473
• Author: Mittal

This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines

Table of contents:

Particles on Surfaces: Adhesion Induced Deformations

Surface Force Tensile Interactions Between Micrometer Size Particles and a Polyester-PDMS Block Copolymer Substrate

Polymer to Particle Adhesion Probed with Atomic Force Microscopy

Surface Particle Contamination Identification in Microelectronics

An Overview of Spacecraft Particulate Contamination Phenomena

Contamination on Optical Surfaces—Concerns, Prevention, Detection, and Removal

An Advanced Surface Particle and Molecular Contaminant Identification, Removal, and Collection System

The Role of Air Ionization in Reducing Surface Contamination by Particles in the Cleanroom

Selecting a Contamination-Free Deburring Process: Testing Abrasive Blasting Media

Particle Generation and Control in Tubing and Piping Connection Design

Detection and Identification of Particles on Silicon Surfaces

The Characterization of Particles on Spacecraft Returned from Orbit

A Light-Scattering Method for Determining the Composition of Particles on Surfaces

Light Scattering by Spherical Particles on Planar Multi-Layered Substrates

New Test Procedure for the Examination of the Particulate Cleanliness of Technical Surfaces

Discrimination Between Particulate and Film Type Contamination on Surfaces by Means of Total Reflection X-Ray Fluorescence Spectrometry

Particle Characterization on Surfaces by Auger Electron Spectroscopy

Interrogating the Behavior of Micrometer-Sized Particles on Surfaces with Focused Acoustic Waves

Removal of Glass Particles from Glass Surfaces: A Review

Particle Removal Characteristics of Surface Cleaning Methods Involving Sonication and/or Spray Impingement

Fluid Dynamics of Liquid Jets Used for Particle Removal from Surfaces

Enhanced Particle Removal from Inertial Guidance Instrument Parts by Fluorocarbon Surfactant Solution

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